US: 3-D technology to be tested for carry-on bags at JFK Airport

Travellers at JFK Airport in New York will soon experience a test of more advanced, three-dimensional imaging to screen carry-on bags. The TSA and American Airlines said Thursday that a test of computed-tomography scanners will start later this month at JFK's Terminal 8. The machines let screeners manipulate 3-D images to get a better idea of what's inside a bag. TSA has been running similar tests in Phoenix and Boston since last year. TSA uses 3-D imaging to scan checked bags, but until recently the scanners have been too large and heavy for use at security checkpoints. Instead, screeners use older X-ray technology to inspect carry-on bags. TSA Administrator David Pekoske says 3-D scanning will improve security right away.<br/>